Comparison of film measurements and Monte Carlo simulations of dose delivered with very high‐energy electron beams in a polystyrene phantom

Abstract

The authors demonstrate that relative dose distributions for VHEE beams of 50-70 MeV can be measured with Gafchromic films and modeled with Monte Carlo simulations to an accuracy of 5%. The reported absolute dose differences likely caused by imperfect beam steering and subsequent charge loss revealed the importance of accurate VHEE beam control and diagnostics.