Publication | Closed Access
Simultaneous Observation of Diffusion-Induced Dislocation Slip Patterns in Si With Electron Beam Scanning and Optical Means
33
Citations
5
References
1964
Year
Optical MeansEngineeringDislocation InteractionPhysicsSimultaneous ObservationApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorElectron Beam ScanningMicrostructure
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