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Evidence for A Sharp Absorption Edge in Amorphous Ge
112
Citations
14
References
1969
Year
Materials ScienceHigh DensityIi-vi SemiconductorEngineeringPhysicsAmorphous GeOptical PropertiesForbidden BandOptical GlassApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialCrystalline GeAmorphous SolidOptoelectronics
A sharp optical absorption edge has been found at about 0.5 eV for amorphous Ge on a quartz substrate. The edge is comparable in sharpness with the direct edge of crystalline Ge. No evidence for tailing of the band edges into the forbidden band or for a high density of states in the forbidden band is found by these optical measurements. A new density determination gives a value of 4.54\ifmmode\pm\else\textpm\fi{} 0.14 g/${\mathrm{cm}}^{3}$.
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