Scanning positron microbeam

Abstract

The construction and operation of a scanning positron microbeam is reported. The positrons are obtained from a doubly remoderated positron beam with a normalized brightness-per-volt of 1.8×105 e+ s−1 cm−2 rad−2 V−1 Ci−1. The beam of 8000 e+ s−1 is brought to a 10×50 μm2 focus by a sectored lens and is scanned across a test grid. Possible applications to defect spectroscopy and the observation of small samples will be discussed.