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Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores
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2003
Year
Photonic SensorOptical MaterialsEngineeringOptical TestingPorous MembraneReflectivity ChangesMicro-optical ComponentSilicon On InsulatorPorous BodyOptical ReflectivityOptical PropertiesPorous Silicon StructuresReflectancePlanar Waveguide SensorNanophotonicsPhotonicsPorous Silicon LayersRefractive IndexPore StructureMicrofabricationSurface ScienceApplied PhysicsPorosityOptical Sensor
The sensitivity of the optical reflectivity of porous silicon structures to the refractive index of liquid within the pores is studied for a single layer, a Bragg mirror and a microcavity. Sucrose solutions of concentration in the range 0.05 to 1.0% by weight are introduced into the pores within a flow cell in order to change the refractive index of the liquid in the pores from 1.3330 to 1.3344. Optimum wavelengths for detection via reflectivity changes are determined based on a signal to noise analysis. The optical thickness of the single layer is also monitored by measuring the fringe spacing via a Fourier transform technique. It is just possible to detect the effect of a change in refractive index of liquid in the pores of 0.00007 for both the reflectivity and optical thickness approaches.