2013 · 73 citations · 5 references
EngineeringElectrical EngineeringAnalog ElectronicsFault ToleranceMicroelectronicsAnalog Integrated CircuitsAnalog IntegrationCmos Circuit DesignDigital Integrated CircuitsLow-noise Circuit DesignMixed-signal Integrated Circuit DesignAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital ConvertersBackground CalibrationBicmos TechnologyCmos Analog Integrated CircuitsComparator DesignComparators
Metastable events in ADC comparators cause large errors that cannot be tolerated in test and measurement applications that record data over extended time intervals. This work utilizes BiCMOS technology to provide high dynamic range analog-to-digital conversion at 2.5GS/s with a metastable error rate of less than one error per year and better than 78dB SFDR over a 1GHz BW.
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