Analysis of interface states and series resistance of Ag/SiO2/n-Si MIS Schottky diode using current–voltage and impedance spectroscopy methods - Concepedia

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Analysis of interface states and series resistance of Ag/SiO2/n-Si MIS Schottky diode using current–voltage and impedance spectroscopy methods

41

Citations

32

References

2007

Year

Mustafa Okutan, F. Yakuphanoğlu

Microelectronic Engineering

Semiconductor TechnologyElectrical EngineeringEngineeringInterface StatesApplied PhysicsSeries ResistanceSemiconductor MaterialImpedance Spectroscopy MethodsMicroelectronicsSemiconductor Device

References

	Year	Citations

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