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Electron-impact ionization cross section of neon ( sigma<sub>n+</sub>, n=1-5)
48
Citations
21
References
1995
Year
EngineeringNuclear PhysicsPhysicsElectron SpectroscopyNatural SciencesApplied PhysicsElectron ImpactAtomic PhysicsTime-of-flight TechniqueIntegrated Oscillator StrengthsIon BeamIon EmissionIon Process
Multiple ionization cross sections of neon (Ne-Nen+, with n=1-5) by electron impact have been measured with energies ranging from threshold up to 3000 eV, by a time-of-flight technique. A comparison with other experimental data is presented. The integrated oscillator strengths (Mn+2) for the processes have been determined showing a good agreement with previous reported data.
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