Accurate layers determination of graphene on transparent substrate based on polarization-sensitive absorption effect

Abstract

Based on the polarization-sensitive absorption effect, we have proposed a method to accurately count the number of carbon atomic layers for both exfoliated and chemical vapor deposition graphene sheets on transparent substrate. With spatial scanning, the three-dimensional imaging of graphene sample can be achieved to test the uniformity of the sample. In addition, our method serves for graphene test on transparent substrate, which is different from the commonly used SiO2/Si substrate. Moreover, this method is also applicable to layers counting of other two-dimensional materials. Therefore, it paves the way for applications of two-dimensional materials on transparent medium.