Publication | Closed Access
Line shape measurements of atoms sputtered from polycrystalline Cu, Zn, and Al by 300 keV Ar+ bombardment
46
Citations
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References
1976
Year
Materials ScienceMaterials EngineeringPolycrystalline CuSurface CharacterizationLine Shape MeasurementsEngineeringPhysicsSurface AnalysisSurface ScienceApplied PhysicsKev Ar+ BombardmentElectron DiffractionChemical DepositionMicrostructureSurface Reconstruction
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