Resistive switching and data reliability of epitaxial (Ba,Sr)TiO3 thin films

Abstract

We report on resistive switching of capacitor-like SrRuO3∕Ba0.7Sr0.3TiO3∕Pt thin films epitaxially grown on SrTiO3 substrates. We observe a weak but stable hysteresis in the current-voltage curve. By applying short voltage pulses, a high or low resistive state as well as intermediate states can be addressed even at room temperature. We demonstrate a multiple-branch hysteresis curve corresponding to multilevel switching modus revealing different subloops for different write voltages. Furthermore reliability issues such as cycling endurance and data retention are presented. Read-write operations over 10000cycles show a fatigue-like drift of both resistance states. No data loss is found upon continuous readout.