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Novel Positive-Tone Chemically Amplified Resists with Photoacid Generator in the Polymer Chains

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2001

Year

Abstract

The successful synthesis of a series of positive-tone chemically amplified (CA) resists, with photoacid generating units incorporated in the resist matrix, is reported. The resists are found to exhibit excellent film formation behavior and an extremely high sensitivity, which makes them potential candidates for low-voltage electron beam (EB) lithography (a typical pattern is shown in the Figure).