Interfacial insertion of a poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) layer between the poly(3-hexyl thiophene) semiconductor and cross-linked poly(vinyl alcohol) insulator layer in organic field-effect transistors

Abstract

The role of a thin layer of conductive poly(3,4-ethylenedioxythiophene) doped with polystyrene sulfonate (PEDOT : PSS), inserted between the gate dielectric and the active layer in poly(3-hexylthiophene)-based transistors was investigated. The devices were fabricated in the bottom-gate top-contact geometry by using cross-linked poly(vinyl alcohol) as the dielectric, whereas the PEDOT : PSS layer was prepared by using an aged aqueous dispersion with addition of different amounts of dimethyl sulfoxide (DMSO) as a secondary dopant. Under these conditions, both a significant reduction in the number of electrically active traps at the interface with the semiconductor and an improvement in the field-effect mobility were obtained, whereas the low power consumption was preserved. The threshold voltage was also displaced by approximately −1 V.