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Interpretation of the two-components observed in high resolution X-ray diffraction ω scan peaks for mosaic ZnO thin films grown on c-sapphire substrates using pulsed laser deposition

Materials ScienceScan PeaksX-ray SpectroscopyEngineeringOptical PropertiesOxide ElectronicsX-ray DiffractionApplied PhysicsLaser DepositionC-sapphire SubstratesLaser-assisted DepositionThin FilmsPulsed Laser Deposition