Numerical techniques for the analysis of lossy films

Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry

Frank L. McCrackin, Robert R. Stromberg, Harold L. Steinberg · Journal of Research of the National Bureau of Standards Section A Physics and Chemistry · 1963 · 618 citations · Full text

Natural Sciences, Chemistry, Materials Science +17

Determination of the Properties of Films on Silicon by the Method of Ellipsometry

R. J. Archer · Journal of the Optical Society of America · 1962 · 255 citations

Natural Sciences, Materials Engineering, Materials Science +16

Ellipsometry in the Measurement of Surfaces and Thin Films

Eliο Passaglia, R. R. Stronberg, Jörg Krüger et al. · Journal of The Electrochemical Society · 1965 · 208 citations

Natural Sciences, Chemistry, Materials Science +12

Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*

N. M. Bashara, D.W. Peterson · Journal of the Optical Society of America · 1966 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +14