Publication | Closed Access
The influence of bulk traps on the subthreshold characteristics of an organic field effect transistor
50
Citations
6
References
2003
Year
Device ModelingElectrical EngineeringEngineeringPhysicsOrganic ElectronicsNanoelectronicsBias Temperature InstabilitySubthreshold CharacteristicsApplied PhysicsOrganic SemiconductorBulk TrapsMicroelectronicsSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1