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A universal high-temperature device for single-crystal diffraction
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1978
Year
Materials ScienceSingle-crystal DiffractionEngineeringPhysicsOptical PropertiesUniversal High-temperature DeviceResistance WireApplied PhysicsTemperature MeasurementCrystal Growth TechnologyCrystal TemperatureThermodynamicsHeat TransferInstrumentationCrystal FormationCrystallographyDiffractive Optic
The construction of a heating device for single-crystal diffraction is presented. The device operates with two coaxial gas streams, the central one of which is electrically heated by means of a resistance wire. As a result the crystal temperature is not affected by external factors such as flowing air etc. Temperatures up to 1000 K can be reached and maintained to within 1 K for extended periods. The device fits on a standard goniometer head and can, without any special options, be installed on any single-crystal diffractometer or camera.