Publication | Closed Access
Analysis of electrical characteristics of polycrystalline silicon thin-film transistors under static and dynamic conditions
38
Citations
9
References
1997
Year
Device ModelingElectrical CharacteristicsElectrical EngineeringSemiconductor DeviceEngineeringBias Temperature InstabilityApplied PhysicsDynamic ConditionsSilicon On InsulatorElectrical Insulation
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