Direct measurements of field-induced strain at magnetoelectric interfaces by grazing incidence x-ray diffraction

Abstract

The magnetic field induced strain at the interface of a magnetoelectric composite, consisting of a ZnO(001) piezoelectric substrate and an amorphous (Fe90Co10)78Si12B10 magnetostrictive layer, was directly determined by grazing incidence X-ray diffraction. Upon applying a magnetic field along the [110] direction, the ZnO single crystal is under tensile strain in [110] direction and compressive strain in [1-10] direction, in agreement with the magnetostriction in the (Fe90Co10)78Si12B10 layer. At room temperature, the saturation strain along [1-10] of about 3 × 10−5 is close to the saturation magnetostriction of the film measured with the cantilever bending technique.