Ultramicroscopy · 1990 · 25 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationOptical MaterialsSurface ScienceRefractive IndexSilicon MaterialsSurface CharacterizationSurface MetrologySurface RoughnessThin Film Optical PropertiesFresnel DiffractionMultilayer MaterialsOptical Surface Roughness MeasurementSurface Roughness MeasurementThin Film Surface Roughness
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Electron Microscopy of Thin Crystals
Nature · 1963 · 4K citations
Electron microscopy of thin crystals
M.E. Haine · Vacuum · 1966 · 2.4K citations
Digital image processing: The semper system
W. O. Saxton, Tony Pitt, Marc Horner · Ultramicroscopy · 1979 · 357 citations
The physics of SiO2 and its interfaces
W. Beall Fowler · Journal of Colloid and Interface Science · 1980 · 238 citations