Philosophical Magazine Letters · 1992 · 27 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceAnalytical ChemistryMetallurgyAlloysDislocation MechanicsElectron MicroscopyMicrostructure AnalysisStacking FaultsX-ray CrystallographyAlloy Segregation PatternsDislocationsElectron Microscopy Of Stacking FaultsField Emission
Abstract X-ray microanalysis using an analytical electron microscope equipped with a cold field emission gun has been applied to the detection of the Suzuki segregation of solute atoms onto the stacking faults of extended dislocations in a Cu–Si alloy. Direct evidence for Suzuki segregation has been obtained.
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