Direct evidence for Suzuki segregation obtained by high-resolution analytical electron microscopy

Takeo Kamino, Y. Ueki, Hideki Hamajima, Katsuhiro Sasaki, Kensuke Kuroda, H. Saka

Philosophical Magazine Letters · 1992 · 27 citations · 3 references

Concepts

Abstract

Abstract X-ray microanalysis using an analytical electron microscope equipped with a cold field emission gun has been applied to the detection of the Suzuki segregation of solute atoms onto the stacking faults of extended dislocations in a Cu–Si alloy. Direct evidence for Suzuki segregation has been obtained.

References

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