X-Ray Diffraction Study on YBa₂Cu₃O_7-δ Epitaxial Thin Film Grown by an Activated Reactive Evaporation Method

Abstract

The as-grown epitaxial thin film of YBa 2 Cu 3 O 7-δ with T c ∼90 K on a (001) SrTiO 3 substrate is investigated by means of X-ray diffraction. It is clearly shown that the c -axis is perpendicular to the SrTiO 3 (001) plane and no evidence of a -axis normal appears. Microtwin structures are observed, indicating that the crystal is orthorhombic. The domain size and mosaic spread are also reported.