Influences of cracking of coated superconducting layer on voltage-current curve, critical current, and n-value in DyBCO-coated conductor pulled in tension

Shojiro Ochiai, Takahiro Arai, A. Toda, Hiroshi Okuda, M. Sugano, Kōzō Osamura, W. Prusseit

Journal of Applied Physics · 2010 · 31 citations · 20 references

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Abstract

Influences of cracking of coating layer under applied tensile strain on V(voltage)-I(current) curve, critical current, and n-value of DyBa2Cu3O7−δ coated conductor were studied experimentally and analytically. The experimentally measured variations in V-I curve, critical current, and n-value with increasing applied strain and the correlation of n-value to critical current were described well by the partial crack-current shunting model of Fang et al. Also, the variations in the ratio of shunting current to overall critical current and the ratio of voltage developed in the cracked region to overall voltage with extension of crack, and the variation in critical current with the ratio of noncracked area to overall cross-sectional area of superconducting layer were revealed.

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