Publication | Closed Access
282-nm AlGaN-based deep ultraviolet light-emitting diodes with improved performance on nano-patterned sapphire substrates
209
Citations
23
References
2013
Year
Optical MaterialsEngineeringNano-patterned Sapphire SubstratesOptoelectronic DevicesNanoelectronicsAln Coalescence ThicknessFlat SapphireNanophotonicsMaterials ScienceNanosphere Lithography TechniqueElectrical EngineeringPhotoluminescenceImproved PerformanceOptoelectronic MaterialsNew Lighting TechnologyAluminum Gallium NitrideCategoryiii-v SemiconductorSolid-state LightingApplied PhysicsNanofabricationOptoelectronics
We first report AlGaN-based deep ultraviolet light-emitting diodes (UV-LEDs) grown on nano-patterned sapphire substrates (NPSS) prepared through a nanosphere lithography technique. The AlN coalescence thickness on NPSS is only 3 μm due to AlN's nano-scaled lateral growth, which also leads to low dislocation densities in AlN and epi-layers above. On NPSS, the light-output power of a 282-nm UV-LED reaches 3.03 mW at 20 mA with external quantum efficiency of 3.45%, exhibiting 98% better performance than that on flat sapphire. Temperature-dependent photoluminescence reveals this significant enhancement to be a combination of higher internal quantum efficiency and higher light extraction efficiency.
| Year | Citations | |
|---|---|---|
Page 1
Page 1