Publication | Closed Access
Effects of Cu stoichiometry on the microstructures, barrier-layer structures, electrical conduction, dielectric responses, and stability of CaCu3Ti4O12
204
Citations
18
References
2006
Year
Materials ScienceMaterials EngineeringElectrical EngineeringBarrier-layer StructuresElectrical ConductionEngineeringMaterial AnalysisMaterial PropertyApplied PhysicsCalcium AluminateCu StoichiometryElectrical PropertyElectrical Insulation
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