Concepedia

Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standards

Peter Williams, Katherine M. Stika, John Davies, Thomas E. Jackman

Nuclear Instruments and Methods in Physics Research · 1983 · 24 citations · 9 references

DOI

Concepts

References

9

A note on the 3He + D nuclear-reaction cross section

W. Möller, Flemming Besenbacher · Nuclear Instruments and Methods · 1980 · 217 citations

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Profiling hydrogen in materials using ion beams

J. F. Ziegler, Chih-Wei Wu, Peter Williams et al. · Nuclear Instruments and Methods · 1978 · 203 citations · Full text

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Isotope fractionation in secondary ion mass spectrometry

Nobumichi Shimizu, Stanley R. Hart · Journal of Applied Physics · 1982 · 162 citations

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Absolute coverage measurement of adsorbed CO and D2 on platinum

John Davies, P.R. Norton · Nuclear Instruments and Methods · 1980 · 115 citations

, , +11

Ion implantation for in-situ quantitative ion microprobe analysis

D. P. Leta, George H. Morrison · Analytical Chemistry · 1980 · 98 citations

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