Philosophical magazine · 1977 · 28 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceElectrochemistrySurface ScienceThin FilmsAlloysElectron MicroscopyMetalsMicrostructure AnalysisSpecimen ProcessingX-ray SpectroscopyChemical EtchingEtchingMetallurgical Microstructure AnalysisMicroanalysisScanning Transmission Electron MicroscopySpecimen Preparation For MicroscopySurface Film Formation
Abstract Measurements have been made on the variation with thickness of the ratio between the X-ray count rates for CuKα and AIKα in thin foils of an aged A1 6% Zn, 1.98% Mg, 1.34% Cu alloy using scanning transmission electron microscopy. Accurate microanalysis is prevented by what appears to be a copper-rich surface film, probably formed during electrochemical preparation of the specimen. The film is not removed by ion beam thinning but is reduced by chemical etching. The implication of the results in general for microanalysis of thin films is discussed and the importance of specimen preparation emphasized.
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