Microstructural and electromagnetic characterization of La2−xSrxCuO4

D. C. Larbalestier, M. Daeumling, Peter J. Lee, Thomas F. Kelly, J. M. Seuntjens, C. Meingast, X. Y. Cai, J.C. McKinnell, Rebecca D. Ray, R. G. Dillenburg,

Cryogenics · 1987 · 22 citations · 4 references

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