Efficiency of quasiparticle evacuation in superconducting devices

Abstract

The diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction is studied. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.