Applied Physics Letters · 2009 · 71 citations · 17 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsNanoelectronicsOxide SemiconductorsThin-film TransistorsMobility ExtractionOxide Thin-film TransistorsSemiconductor Oxide Thin FilmsThin Oxide FilmsThin-film OxidesZinc Oxide Nanostructures
Field-effect mobilities are the most important figures of merit to evaluate the feasibility of semiconductors for thin-film transistors (TFTs). They are, however, sometimes extracted from TFTs with the active semiconductor area undefined and in small channel ratios without the effect of the fringing electric field at the ends of source/drain electrodes taken into account. In this letter, it is demonstrated that the field-effect mobilities extracted from undefined nanoparticulate zinc oxide (ZnO) TFTs at the channel ratio of 2.5 are overestimated by 418%, and the choice of large channel ratios gives the real value of field-effect mobilities.
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Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor
Kenji Nomura, Hiromichi Ohta, Kazushige Ueda et al. · Science · 2003 · 1.9K citations
ZnO-based transparent thin-film transistors
Randy Hoffman, B. Norris, John F. Wager · Applied Physics Letters · 2003 · 1.4K citations
Natural Sciences, Electrical Engineering, Materials Science +17