Applied Physics Letters · 1996 · 47 citations · 0 references
Optical MaterialsEngineeringThin Film Process TechnologyStrontium Barium NiobateFerroelectric ApplicationOptical PropertiesSuperconductivityR33 CoefficientPulsed Laser DepositionReflection-grating Measurement TechniqueEpitaxial GrowthThin Film ProcessingMaterials ScienceOxide ElectronicsCoplanar ElectrodesSemiconductor MaterialOptical CeramicOptoelectronicsApplied PhysicsCondensed Matter PhysicsThin FilmsLarge Electro-optic Coefficients
A reflection-grating measurement technique is reported for measurement of the electro-optic coefficient in crystalline strontium barium niobate thin films grown using pulsed laser deposition. The measurement yields a value of about 350 pm/V for the r33 coefficient of the Sr0.6Ba0.4Nb2O6(SBN:60) film. The measurement technique is based on a modulated diffraction pattern measurement using coplanar electrodes and can be extended to a range of cases where it is not possible to deposit electrodes on both sides of a film.