Publication | Closed Access
Measurement and modelling of sensitivity and noise of MOS magnetic field-effect transistors
27
Citations
3
References
1997
Year
Device ModelingMagnetismElectrical EngineeringEngineeringPhysicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsMagnetic ResonanceNoiseMicroelectronicsMagnetic SensorElectromagnetic Compatibility
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