Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy - Concepedia

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Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy

25

Citations

14

References

1991

Year

Jin Zou, B. F. Usher, D. J. H. Cockayne, Rob W. Glaisher

Journal of Electronic Materials

Electrical EngineeringInxga1-xas/gaas Strained-layer SystemEngineeringTransmission Electron MicroscopyApplied PhysicsMolecular Beam EpitaxyEpitaxial GrowthOptoelectronicsCritical Thickness Determination

References

	Year	Citations

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