Journal of Applied Physics · 1994 · 244 citations · 20 references
EngineeringMaterials EngineeringMaterials ScienceOptical MaterialsOptoelectronicsSemiconductor MaterialsEpitaxial GrowthOptical Properties Of SemiconductorsQuantum DotsSemiconductor Crystal GrowthSemiconductor HeterostructuresSemiconductor PhysicsAnisotropyCrystal FacetsHeteroepitaxyMolecular Beam EpitaxyOptical PropertiesPhotoluminescence SpectroscopyPolarizationReflection High-energy Electron Diffraction
A few mololayers of InAs is heteroepitaxially grown on GaAs substrate by molecular-beam epitaxy. Structure and optical properties are investigated. Reflection high-energy electron-diffraction observation reveals that an InAs layer forms a three-dimensional structure with specific facets after two-dimensional growth. The transmission electron microscope observation shows that these structures have structural anisotropy in the growth plane. Photoluminescense spectroscopy shows that the luminescence from the InAs structures exhibits the polarization property caused by the quantum dot effect of the structural anisotropy.
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J. M. Gaines, P. M. Petroff, H. Kroemer et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1988 · 288 citations
Takashi Fukui, Hisao Saito · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1988 · 198 citations