Publication | Closed Access
Characterization of SiO2 and TiO2 films prepared using rf magnetron sputtering and their application to anti-reflection coating
191
Citations
15
References
2004
Year
Materials EngineeringMaterials ScienceEngineeringOxide ElectronicsSurface ScienceApplied PhysicsRf MagnetronTio2 FilmsAnti-reflection CoatingThin FilmsDepth-graded Multilayer CoatingThin Film Processing
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