A confocal beam scanning white‐light microscope

Abstract

SUMMARY We report on a confocal beam scanning microscope utilizing a continuous Xe short‐arc lamp operating in the visible spectrum with unprecedented radiance. Measurements of lateral and vertical resolution will be presented and compared with those of an equivalent scanning laser microscope. Resolution of the white‐light microscope is equivalent to that of the scanning laser microscope. White‐light microscope images positively stand out from those of the scanning laser microscope by their lack of artefacts caused by interference.