Application of convergent beam electron diffraction to study the stacking of layers in transition-metal dichalcogenides - Concepedia

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Application of convergent beam electron diffraction to study the stacking of layers in transition-metal dichalcogenides

43

Citations

3

References

1980

Year

K. K. Fung, J. W. Steeds, J. Eades

Materials ScienceIi-vi SemiconductorTransition Metal ChalcogenidesEngineeringPhysicsTopological HeterostructuresApplied PhysicsCondensed Matter PhysicsElectron DiffractionLayered MaterialCrystallographyTransition-metal Dichalcogenides

References

	Year	Citations

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