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Product-ion distributions for some ion-molecule reactions
159
Citations
23
References
1976
Year
Chemical EngineeringProduct-ion DistributionsSift TechniqueEngineeringPhysicsReaction ProcessNatural SciencesIon ExchangePhysical ChemistrySift ApparatusComputational ChemistryCatalysisQuantum ChemistryChemistryHe+ IonsChemical KineticsIon StructureIon Process
The reactions of He+ ions with N2, O2, CO2, and CH4, and of C+ and N+ ions with O2 are presented. The measurements were carried out in the SIFT apparatus (selected ion flow tube), which involves the injection of a mass-selected positive-ion beam into a flowing neutral gas into which a reactant gas is introduced at a position downstream in the flow. Data acquisition and analysis are made by the flowing afterglow technique. The results for the He++N2 reaction agree with the previously established branching ratio. For the other reactions, considerable differences are apparent between the product distributions obtained and those previously reported and an explanation is attempted. A brief discussion of the reaction mechanism is presented for each reaction in the light of the determined product distributions, and the anticipated development of the SIFT technique for ion-molecule reaction mechanisms is outlined.
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