Nano Letters · 2010 · 110 citations · 2 references
EngineeringElectrical EngineeringMaterials EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsIii-v SemiconductorsIntegrated Circuit DevicesIntegrated Circuit FabricationLight-emitting DiodesNanoelectronicsPhotodetectorsAvalanche Photodiode DetectorsAvalanche PhotodiodesCmos-compatible PhotonicsIntegration Of Iii-v MaterialsLight-emitting DevicesMultiplication FactorPhotodiodesSilicon
Monolithic integration of III-V compound semiconductor devices with silicon CMOS integrated circuits has been hindered by large lattice mismatches and incompatible processing due to high III-V epitaxy temperatures. We report the first GaAs-based avalanche photodiodes (APDs) and light emitting diodes, directly grown on silicon at a very low, CMOS-compatible temperature and fabricated using conventional microfabrication techniques. The APDs exhibit an extraordinarily large multiplication factor at low voltage resulting from the unique needle shape and growth mode.
2
Electrically pumped hybrid AlGaInAs-silicon evanescent laser
Alexander W. Fang, Hyundai Park, Oded Cohen et al. · Optics Express · 2006 · 1.2K citations · Full text
<i>Physics of Optoelectronic Devices</i>
Shun Lien Chuang, N. Peyghambarian, S. W. Koch · Physics Today · 1996 · 1.2K citations