High-Speed Computation of Single and Coupled Microstrip Parameters Including Dispersion, High-Order Modes, Loss and Finite Strip Thickness

Abstract

Based on an optimized rigorous hybrid mode solution for covered/open zero thickness microstrip patterns the following frequency dependent single and coupled line data are evaluated with very short CP-times: The characteristic impedances of the even and odd quasi-TEM modes, the propagation/attenuation constants and associated strip current density components of these and the higher order modes, the loss of the dominant modes under consideration of nonuniform strip current, substrate surface roughness and dielectric loss tangent. Finite strip thickness is introduced by a correction of the strip width input values.