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Secondary-electron yields from thin foils: A possible probe for the electronic stopping power of heavy ions
118
Citations
39
References
1990
Year
Se YieldProjectile DependenceEngineeringNuclear PhysicsPhysicsUltrahigh VacuumNatural SciencesElectron SpectroscopyApplied PhysicsCondensed Matter PhysicsAtomic PhysicsThin FoilsIon BeamElectron PhysicVacuum DeviceIon EmissionHeavy IonsSecondary-electron Yields
We have measured heavy-ion-induced (${Z}_{P}$=2,10,18,36,54; 15 keV/u\ensuremath{\le}${E}_{P}$/${M}_{P}$\ensuremath{\le}600 keV/u secondary-electron (SE) yields from sputter-cleaned entrance (${\ensuremath{\gamma}}_{B}$) and exit surfaces (${\ensuremath{\gamma}}_{F}$) of thin solid foils (C, Al, Ti, Ni, and Cu; d\ensuremath{\approxeq}1000 A\r{}) in ultrahigh vacuum (p${=10}^{\mathrm{\ensuremath{-}}7}$ Pa). A pronounced increase of the forward to backward SE yield ratio R=${\ensuremath{\gamma}}_{F}$/${\ensuremath{\gamma}}_{B}$ with increasing ${Z}_{P}$ is observed. The SE yield to energy-loss ratio ${\ensuremath{\Lambda}}^{\mathrm{*}}$=\ensuremath{\gamma}/${S}_{e}$ has been found to be smaller for heavy ions (HI) than for light ions (H and He); i.e., ${\ensuremath{\Lambda}}^{\mathrm{*}}$(HI)${\ensuremath{\Lambda}}^{\mathrm{*}}$(He)${\ensuremath{\Lambda}}^{\mathrm{*}}$(H). Also, at low projectile velocities (${v}_{P}^{2}$50 keV/u), the value of ${\ensuremath{\Lambda}}^{\mathrm{*}}$ increases with decreasing ${v}_{P}$. The velocity and projectile dependence of both R and ${\ensuremath{\Lambda}}^{\mathrm{*}}$ can be described within simple extensions of Schou's SE emission transport theory and a semiempirical Sternglass-type model introduced by Koschar and co-workers as caused by nonequilibrium projectile energy losses ${S}_{e}^{\mathrm{*}}$ near the surfaces. The near-surface energy losses are reduced compared to tabulated bulk energy loss values ${S}_{e}$ both for forward and backward emission under the assumption of a proportionality between SE yields and dE/dx. The ${Z}_{P}$-dependent reduction factors, i.e., the ratios ${S}_{e}^{\mathrm{*}}$/${S}_{e}$, as well as material parameters \ensuremath{\Lambda}=\ensuremath{\gamma}/${S}_{e}^{\mathrm{*}}$, are deduced from the SE yield measurements. Nevertheless, a rough overall proportionality \ensuremath{\gamma}\ensuremath{\sim}dE/dx over four decades of both forward and backward secondary-electron yields \ensuremath{\gamma} and electronic energy losses dE/dx in a wide range of projectile velocities (15 keV/u \ensuremath{\le}${E}_{P}$/${M}_{P}$\ensuremath{\le}16 MeV/u) and projectile nuclear charges ${Z}_{P}$ (1\ensuremath{\le}${Z}_{P}$\ensuremath{\le}92) is found.
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