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1.54 μm photoluminescence of Er3+ doped into SiO2 films containing Si nanocrystals: Evidence for energy transfer from Si nanocrystals to Er3+
536
Citations
13
References
1997
Year
Optical MaterialsEngineeringSi NanocrystalsOptoelectronic DevicesChemistrySilicon On InsulatorLuminescence PropertySio2 FilmsSemiconductor NanostructuresSemiconductorsElectronic DevicesCompound SemiconductorSio 2PhotoluminescenceNanotechnologyPhotonic MaterialsOptoelectronic MaterialsEnergy TransferμM PhotoluminescenceLuminescence PeaksApplied PhysicsOptoelectronics
SiO 2 films containing Si nanocrystals (nc-Si) and Er were prepared and their photoluminescence (PL) properties were studied. The samples exhibited luminescence peaks at 0.81 and 1.54 μm, which could be assigned to the electron-hole recombination in nc-Si and the intra-4f transition in Er3+, respectively. Correlation between the intensities of the two luminescence peaks was studied as functions of Er concentration and excitation power. The present results clearly demonstrate that excitation of Er3+ occurs through the recombination of photogenerated carriers spatially confined in nc-Si and the subsequent energy transfer to Er3+.
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