Publication | Open Access
Experimental and theoretical investigation of the electronic structure of Cu2O and CuO thin films on Cu(110) using x-ray photoelectron and absorption spectroscopy
308
Citations
52
References
2013
Year
X-ray SpectroscopyEngineeringX-ray Absorption EnergiesChemistryX-ray PhotoelectronElectronic StructureThin Film ProcessingMaterials ScienceOxide ElectronicsPhysical ChemistryCuo Thin FilmsElemental MetalTransition Metal ChalcogenidesCopper Oxide MaterialsMaterial AnalysisSurface ScienceApplied PhysicsCondensed Matter PhysicsThin Films
The electronic structure of Cu(2)O and CuO thin films grown on Cu(110) was characterized by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The various oxidation states, Cu(0), Cu(+), and Cu(2+), were unambiguously identified and characterized from their XPS and XAS spectra. We show that a clean and stoichiometric surface of CuO requires special environmental conditions to prevent loss of oxygen and contamination by background water. First-principles density functional theory XAS simulations of the oxygen K edge provide understanding of the core to valence transitions in Cu(+) and Cu(2+). A novel method to reference x-ray absorption energies based on the energies of isolated atoms is presented.
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