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Avalanche multiplication in AlGaN based solar-blind photodetectors
98
Citations
13
References
2005
Year
Electrical EngineeringEngineeringPhysicsOptical PropertiesApplied PhysicsAluminum Gallium NitrideAvalanche MultiplicationElectric-field StrengthUltraviolet IlluminationSynchrotron RadiationCategoryiii-v SemiconductorOptoelectronicsPhotovoltaicsCompound Semiconductor
Avalanche multiplication has been observed in solar-blind AlGaN-based p-i-n photodiodes. Upon ultraviolet illumination, the optical gain shows a soft breakdown starting at relatively low electric fields, eventually saturating without showing a Geiger mode breakdown. The devices achieve a maximum optical gain of 700 at a reverse bias of 60 V. By modeling the device, it is found that this corresponds to an electric-field strength of 1.7MV∕cm.
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