Effect of physical and chemical modifications on microcrystalline parameters of silk fibers

Abstract

Wide-angle X-ray diffraction studies of physically and chemically treated silk fibers like bivoltine mulberry silk and tassar silk were carried out to evaluate their crystal size, lattice distortion, and minimum enthalpy, as these determine the properties of silk fibers. The results are also compared with tenacity measurement. © 1996 John Wiley & Sons, Inc.