A systematic method of estimating the performance of X-ray optical systems for synchrotron radiation. II. Treatment in position-angle–wavelength space

Abstract

Position–angle–wavelength space is introduced to describe X-ray optical properties of various optical elements and their combined systems. This three-dimensional space is a combination of the position-angle space used in the phase-space method and the angle-wavelength space used in the DuMond diagram. Representations in the position–angle–wavelength space are shown for a synchrotron radiation source, a flat perfect crystal, a curved crystal and a double-crystal arrangement. A method of estimating the spatial width, angular divergence, wavelength spread and intensity of the X-ray beam emitted by a given optical system is described by making use of descriptions in the position–angle–wavelength space.