Publication | Closed Access
Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods
59
Citations
21
References
2001
Year
Materials ScienceSurface CharacterizationEngineeringX-ray Spectroscopy MethodsElectron SpectroscopySurface PotentialSurface AnalysisSurface ScienceApplied PhysicsTopological InsulatorElectrical PropertyElectrical Insulation
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