Publication | Open Access
Direct evidence for ferroelectric polar distortion in ultrathin lead titanate perovskite films
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Citations
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References
2006
Year
EngineeringHalide PerovskitesMultiferroicsFerroelectric ApplicationFerroelectric Polar DistortionQuantum MaterialsUnit CellsDirect EvidenceMolecular Beam EpitaxyEpitaxial GrowthMaterials ScienceCrystalline DefectsPhysicsPerovskite MaterialsLead-free PerovskitesFerroelasticsApplied PhysicsCondensed Matter PhysicsFerroelectric MaterialsThin FilmsX-ray Photoelectron DiffractionFunctional Materials
X-ray photoelectron diffraction is used to directly probe the intracell polar atomic distortion and tetragonality associated with ferroelectricity in ultrathin epitaxial $\mathrm{Pb}\mathrm{Ti}{\mathrm{O}}_{3}$ films. Our measurements, combined with ab initio calculations, unambiguously demonstrate noncentrosymmetry in films a few unit cells thick, imply that films as thin as three unit cells still preserve a ferroelectric polar distortion, and also show that there is no thick paraelectric dead layer at the surface.
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