Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry - Concepedia

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Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

64

Citations

7

References

1998

Year

A.D. Dane, A. Veldhuis, Dick K. G. de Boer, A. Leenaers, L.M.C. Buydens

Physica B Condensed Matter

Materials ScienceSurface CharacterizationIncidence X-ray ReflectometryOptical MaterialsX-ray SpectroscopyGenetic AlgorithmsEngineeringOptical PropertiesX-ray DiffractionApplied PhysicsReflectanceDepth-graded Multilayer CoatingX-ray Fluorescence

References

	Year	Citations

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