Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements - Concepedia

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Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements

101

Citations

9

References

1971

Year

Woon‐kie Paik, J. O’M. Bockris

Surface Science

Materials ScienceThin Light-absorbing FilmOptical MaterialsEngineeringOptical PropertiesOptical TestingApplied PhysicsExact Ellipsometric MeasurementLight AbsorptionOptoelectronicsThin Film ProcessingAuxiliary Measurements

References

	Year	Citations

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